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TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS

ECE 553
Course Description

Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.

Prerequisties

COMPSCI/ECE 352 and COMPSCI 300 , graduate/professional standing, or member of Engineering Guest Students

Satisfies

This course does not satisfy any prerequisites.

Credits

3

Offered

Fall

Grade Point Average
3.5

5.47% from Historical

Completion Rate
94.44%

-4.29% from Historical

A Rate
55.56%

67.41% from Historical

Class Size
18

-12.39% from Historical

Instructors (2025 Fall)

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