Spring 2027

Testing and Testable Design of Digital Systems

Covers fault modeling, test generation for combinational/sequential circuits, fault simulation, memory/microprocessor testing, DFT, BIST, and fault location in digital systems.

no offering record for this termCredits unavailable
Recorded instructors · Spring 2027 No instructors listed

Summary

1 / 7

Past student reviews · Azadeh Davoodi

The workload was manageable, but the tests were incredibly long and slightly on the difficult side.

What you’ll be able to do

  • Identify factors that impact economics of testing of integrated circuits

  • Model and simulate faults that can occur in integrated circuits

  • Apply state-of-the-art test generation algorithms

  • Utilize design for testability and built-in self-test techniques

  • Generate tests to detect path delay faults

Source: UW Guide

Grade history

↗
average GPA
letter grades
A
AB
B
BC
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F

All recorded terms · compare terms & instructors

Prerequisites

Course map

COMP SCI/​E C E 352 and COMP SCI 300, graduate/professional standing, or member of Engineering Guest Students

ECE 553

This is a best-effort interpretation; check the catalog requirements above.

Prerequisite text tree

Professors

Spring 2027

No instructors recorded for this selection.

Historical instructors & teaching patterns

AZADEH DAVOODI is recorded teaching in Fall 2022, Spring 2024, Spring 2025. Recorded history may be incomplete and does not establish a future schedule.

KEWAL SALUJA is recorded teaching in Fall 2006, Fall 2007, Fall 2008, Fall 2009, Fall 2010, Fall 2011, Fall 2012, Fall 2013, Fall 2014. Recorded history may be incomplete and does not establish a future schedule.

Recorded history may be incomplete and does not establish a future schedule.

Calendar & sections

Spring 2027

Schedule loads here as you scroll.

SectionModeEnrolled / capacityWaitlist

Times are Central. Select a meeting for details; export includes recorded dates for the selected sections.

Meeting source records
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Student experience

the class

Past student reviews · Azadeh Davoodi

The course material was interesting and easy to follow, though lectures could be dry and exams presented some challenges.

Recent recorded grades — Fall 2022: 3.29 GPA, 45.5% A/AB (n=33 letter grades); Spring 2024: 3.50 GPA, 72.2% A/AB (n=18 letter grades); Spring 2025: 3.53 GPA, 69.6% A/AB (n=46 letter grades).

difficulty & workload

Past student reviews · Azadeh Davoodi

The workload was manageable, but the tests were incredibly long and slightly on the difficult side.

Past student reviews · Azadeh Davoodi

Students found the professor to be a lenient grader who genuinely wanted them to learn, and attending the review session before the final was helpful.

Topics

  • Fault modeling, test generation, fault simulation, memory and microprocessor testing, DFT, BIST, and fault location

Skills

  • Modeling and simulating faults in integrated circuits
  • Applying state-of-the-art test generation algorithms
  • Utilizing design for testability and built-in self-test techniques
  • Generating tests to detect path delay faults

Grades

Latest available · Spring 2025— not enough history to project Spring 2027.

average GPA
A / AB grades
letter grades
Instructor

Grade distribution · % of letter grades

A
AB
B
BC
C
D
F

Grades over time

Through Spring 2025

More grade details Grade mix, volume & source data

Where this course fits relative to

Latest available grades · Spring 2025 · all course levels

GPA

Higher than % of other courses in this group.

Course GPAs · red marks this course’s range

letter grades

More recorded grades than % of other courses in this group.

Typical course in this group: letter grades.

About this comparison

1286 courses over the same term, each with at least 30 recorded letter grades. Cross-listed courses count once. GPA is not a measure of difficulty or teaching quality. The typical course is the median by recorded grade count; tied values are not counted as lower. Grade counts describe course scale, not unique students or typical section size.

Descriptions compare GPA with this group’s average: at least 0.20 higher or lower; otherwise close to average. Section size uses median recorded enrollment: small up to 30, mid-sized 31–99, large 100+. Lectures and discussion/lab sections are described separately.

Sources & history

UW–Madison

Catalog & offerings

Descriptions, prerequisites, and recorded course offerings.

Catalog observation history

Observations at scan time; dates do not imply when a catalog change took effect.

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Selected offering source records

No offering records for the selected term.

Raw records 
[]
Rate My Professors

Student reviews

Original comments behind the course and instructor summaries.

Read original reviews
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Madgrades

Grade history

Recorded grade distributions by term, section, and instructor.

Explore recorded grades
Dataset & model

Recorded 2026-10-14

View the dataset on Hugging Face
Model outputs & technical records
Qwen/Qwen3.8-27B
LLM outputs across runs
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Full model traces

Recorded model configuration, reasoning, and tool conversations.

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Model & dataset provenance 
{
  "model": "Qwen/Qwen3.8-27B",
  "model_revision": "1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0",
  "task_version": "17",
  "output_id": "3e0804dd6201e8238e2a4c66f56fc2447fe2d78d86e812f9409ed029af9643c7",
  "requirements_status": "needs_review",
  "dataset_revision": "fc1811fa52e581ea57a35c0cf3343f8740a8ffbf",
  "observed_at": "2026-10-14 17:50:09.728220+00:00"
}