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TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS

ECE 553
Course Description

Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.

Prerequisites

COMPSCI/ECE 352 and COMPSCI 300 , graduate/professional standing, or member of Engineering Guest Students

Satisfies

This course does not satisfy any prerequisites.

Credits

Not Reported

Offered

Not Reported

Grade Point Average
3.53

5.3% from Historical

Completion Rate
97.83%

-0.71% from Historical

A Rate
50%

38.78% from Historical

Class Size
46

102.94% from Historical

Cumulative Grade Distribution

Instructors (2026 Summr)

Sorted by ratings from Rate My Professors

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