TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS
ECE 553
Course Description
Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
Prerequisties
COMPSCI/ECE 352 and COMPSCI 300 , graduate/professional standing, or member of Engineering Guest Students
Satisfies
This course does not satisfy any prerequisites.
Credits
3
Offered
Fall
Grade Point Average
Completion Rate
A Rate
Class Size
Instructors (2025 Fall)
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