[{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-49752a259f17fab0f49665b3","output_id":"1c234e38ca79299e41073e50ab8847e978c8e2b69d0a72a2cd7fb6a22dda1afa","section":"requirements","status":"needs_review","value_json":"{\"nodes\":[{\"children\":[\"opt_senior_group\",\"opt_graduate_standing\",\"opt_guest_student\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"root_any\",\"kind\":\"any\"},{\"children\":[\"cond_senior_standing\",\"any_prereq\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"opt_senior_group\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"cond_senior_standing\",\"kind\":\"condition\"},{\"children\":[\"cond_ME_306\",\"course_EMA_303\",\"cond_EMA_304\"],\"condition\":null,\"course\":null,\"evidence\":\"(M E 306,E M A 303or 304)\",\"id\":\"any_prereq\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"M E 306\",\"course\":null,\"evidence\":\"M E 306\",\"id\":\"cond_ME_306\",\"kind\":\"condition\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":303,\"minimum_grade\":null,\"subjects\":[\"EMA\"],\"timing\":\"prior\"},\"evidence\":\"E M A 303or 304\",\"id\":\"course_EMA_303\",\"kind\":\"course\"},{\"children\":[],\"condition\":\"304\",\"course\":null,\"evidence\":\"304\",\"id\":\"cond_EMA_304\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"opt_graduate_standing\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"opt_guest_student\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 is absent from linked_courses, so it is represented as a condition leaf with verbatim source clause 'M E 306'.\",\"EMA 304 is not separately linked; represented as a condition leaf using source substring '304' from 'E M A 303or 304'.\",\"The parenthesized comma-separated list is treated as alternatives: ME 306, EMA 303, or EMA 304.\"],\"root\":\"root_any\",\"status\":\"needs_review\"}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":true},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-49752a259f17fab0f49665b3","output_id":"1c234e38ca79299e41073e50ab8847e978c8e2b69d0a72a2cd7fb6a22dda1afa","section":"search_profile","status":"valid","value_json":"{\"activity_tags\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"data-analysis\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":1,\"quote\":\"Work in groups in the formulation of analytical models, configuration of measurement systems, interpretation of experimental and theoretical results, and presentation of conclusions\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"presentations\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":3,\"quote\":\"Evaluate clarity and/or accuracy of written work\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"writing\"}],\"assumed_background\":[],\"search_phrases\":[\"experimental mechanics\",\"mechanical components testing\",\"stress strain deformation measurement\",\"electrical optical recording stress strain\",\"digital data acquisition mechanical engineering\",\"non-destructive testing fracture residual stresses\",\"transducer design sensors\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":0,\"quote\":\"Apply knowledge of experimental techniques and measurement systems for mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying experimental techniques and measurement systems for mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques;\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Recording and processing electrical and optical stress, strain, and deformation data using computer techniques\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying methods to static/transient events, sensor/transducer design, NDT, fracture, and residual stresses\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Using digital data acquisition, computer-aided reduction/display, and commercial software for modeling and analysis\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials. Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques; applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Experimental Mechanics covers methods for analyzing mechanical components, structures, and materials, including electrical/optical recording of stress/strain/deformation and computer-based data techniques.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"design and analysis of mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Design and analysis of mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Electrical and optical recording of stress, strain, and deformation data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Computer acquisition, reduction, and presentation of data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Sensors, transducer design, NDT, fracture, and residual stresses\"}]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":true},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-49752a259f17fab0f49665b3","output_id":"1c234e38ca79299e41073e50ab8847e978c8e2b69d0a72a2cd7fb6a22dda1afa","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":true},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-49752a259f17fab0f49665b3","output_id":"1c234e38ca79299e41073e50ab8847e978c8e2b69d0a72a2cd7fb6a22dda1afa","section":"student_summary","status":"valid","value_json":"{\"context_hash\":\"4c9c7d991e80155a54a5bf66e7b045928835b0a6b9b920f180c3de89b9d0ebe5\",\"course_id\":\"EMA/ME 570\",\"current_instructors\":[],\"difficulty_workload\":[],\"errors\":[],\"historical_context\":[],\"message\":\"No course-specific reviews available\",\"offered\":false,\"profile_hash\":\"3f5110430805ccdd533c0c072df62d68a8a5f5441c4530bbdb15d419a199a09c\",\"quick_take\":[{\"citations\":[{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20261014T203208-0851c9a1\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1194\",\"type\":\"grade\"},{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20261014T203208-0851c9a1\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1212\",\"type\":\"grade\"},{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20261014T203208-0851c9a1\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1232\",\"type\":\"grade\"}],\"text\":\"Recent recorded grades — Spring 2019: 3.46 GPA, 60.9% A/AB (n=23 letter grades); Fall 2020: 3.56 GPA, 68.0% A/AB (n=25 letter grades); Fall 2022: 3.35 GPA, 69.2% A/AB (n=13 letter grades).\"}],\"student_experience\":[],\"task_hash\":\"9dea82ef7f2113a5605c1c6030c4f9b19967eb742cc93a78268fb92357d29f5c\",\"teaching_history\":[],\"term_id\":\"1274\",\"term_name\":\"2027 Sprng\",\"version\":3}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":true},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"e8d481750611ac5af5bb70e70f53d2332b32dc847db08f22921d07b1fdf0dfb8","section":"requirements","status":"invalid","value_json":null,"candidate_json":"{\"nodes\":[{\"children\":[\"n1\",\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"n0\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"n1\",\"kind\":\"condition\"},{\"children\":[\"n4\",\"n5\",\"n6\"],\"condition\":null,\"course\":null,\"evidence\":\"(M E 306,E M A 303or 304)\",\"id\":\"n2\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"n4\",\"kind\":\"condition\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":303,\"minimum_grade\":null,\"subjects\":[\"EMA\"],\"timing\":\"prior\"},\"evidence\":\"E M A 303\",\"id\":\"n5\",\"kind\":\"course\"},{\"children\":[],\"condition\":\"ME 306 or EMA 304\",\"course\":null,\"evidence\":\"M E 306,E M A 303or 304\",\"id\":\"n6\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 and EMA 304 are not found in the linked_courses or lookup results; treated as verbatim conditions requiring review.\",\"The grouping '(M E 306,E M A 303or 304)' is interpreted as requiring Senior Standing AND (ME 306 AND (EMA 303 OR EMA 304)).\"],\"root\":\"n0\",\"status\":\"needs_review\"}","error":"Non-course conditions must preserve verbatim source text","model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"e8d481750611ac5af5bb70e70f53d2332b32dc847db08f22921d07b1fdf0dfb8","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"EMA 303\",\"field\":\"description\",\"quote\":\"Stress and strain, torsion, bending of beams, shearing stresses in beams, compound stresses, principal stresses, deflections of beams, statically indeterminate members, columns.\"}],\"text\":\"Fundamentals of stress, strain, and beam mechanics.\"}],\"search_phrases\":[\"experimental mechanics\",\"stress analysis\",\"strain measurement\",\"transducer design\",\"nondestructive testing\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for mechanical design and analysis.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\"}],\"text\":\"Computer-based data acquisition and reduction.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Sensor and transducer design, NDT, and fracture analysis.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for analyzing mechanical components, structures, and materials using stress and strain data.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\"}],\"text\":\"Stress, strain, and deformation data recording.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Static and transient event applications, NDT, and fracture mechanics.\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"e8d481750611ac5af5bb70e70f53d2332b32dc847db08f22921d07b1fdf0dfb8","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"ae911d123bb7d47fb6378e99d698cb794c71c0372cbef7776d7e38d8374e2f2f","section":"requirements","status":"valid","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"n0\",\"kind\":\"any\"},{\"children\":[\"n4\",\"n5\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"n1\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"n4\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"M E 306,E M A 303or 304\",\"course\":null,\"evidence\":\"M E 306,E M A 303or 304\",\"id\":\"n5\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 and EMA 304 are not found in the linked_courses or lookup results; treated as verbatim conditions requiring review.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"ae911d123bb7d47fb6378e99d698cb794c71c0372cbef7776d7e38d8374e2f2f","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"EMA 303\",\"field\":\"description\",\"quote\":\"Stress and strain, torsion, bending of beams, shearing stresses in beams, compound stresses, principal stresses, deflections of beams, statically indeterminate members, columns.\"}],\"text\":\"Fundamentals of stress, strain, and beam mechanics.\"}],\"search_phrases\":[\"experimental mechanics\",\"stress analysis\",\"strain measurement\",\"transducer design\",\"nondestructive testing\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for mechanical design and analysis.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\"}],\"text\":\"Computer-based data acquisition and reduction.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Sensor and transducer design, NDT, and fracture analysis.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for analyzing mechanical components, structures, and materials using stress and strain data.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\"}],\"text\":\"Stress, strain, and deformation data recording.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Static and transient event applications, NDT, and fracture mechanics.\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"ae911d123bb7d47fb6378e99d698cb794c71c0372cbef7776d7e38d8374e2f2f","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-6556a505c10f448d98d02466","output_id":"ff3443daccdcd00152eb6dee993b0d345ec3959285ee94a715274c6e3180a0f5","section":"requirements","status":"invalid","value_json":null,"candidate_json":"{\"nodes\":[{\"children\":[\"root_any\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"root_all\",\"kind\":\"all\"},{\"children\":[\"opt_senior_group\",\"opt_graduate_standing\",\"opt_guest_student\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"root_any\",\"kind\":\"any\"},{\"children\":[\"cond_senior_standing\",\"any_course_306_303_304\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"opt_senior_group\",\"kind\":\"all\"},{\"children\":[\"course_ME_306\",\"any_EMA_303_304\"],\"condition\":null,\"course\":null,\"evidence\":\"(M E 306,E M A 303or 304)\",\"id\":\"any_course_306_303_304\",\"kind\":\"any\"},{\"children\":[\"course_EMA_303\",\"cond_EMA_304\"],\"condition\":null,\"course\":null,\"evidence\":\"E M A 303or 304\",\"id\":\"any_EMA_303_304\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"opt_graduate_standing\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"opt_guest_student\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"cond_senior_standing\",\"kind\":\"condition\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":306,\"minimum_grade\":null,\"subjects\":[\"ME\"],\"timing\":\"prior\"},\"evidence\":\"M E 306\",\"id\":\"course_ME_306\",\"kind\":\"course\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":303,\"minimum_grade\":null,\"subjects\":[\"EMA\"],\"timing\":\"prior\"},\"evidence\":\"E M A 303\",\"id\":\"course_EMA_303\",\"kind\":\"course\"},{\"children\":[],\"condition\":\"EMA 304\",\"course\":null,\"evidence\":\"304\",\"id\":\"cond_EMA_304\",\"kind\":\"condition\"}],\"notes\":[\"Interpreted comma as OR between ME 306 and EMA 303/304 group.\",\"EMA 304 is not in linked_courses, treated as condition leaf.\"],\"root\":\"root_all\",\"status\":\"needs_review\"}","error":"Node course_ME_306: course {'course_number': 306, 'minimum_grade': None, 'subjects': ['ME'], 'timing': 'prior'} is absent from the source links (linked_courses). Standing, declared programs, and subject credit counts are condition nodes, not courses. Never invent course 0. For a source reference absent from linked_courses, use kind=condition, course=null, condition=<verbatim source clause>, children=[], and needs_review with an explanatory note. Allowed course references: [{'course_number': 303, 'subjects': ['EMA']}].\nNode cond_EMA_304: condition 'EMA 304' must be a nonempty literal source substring. Its evidence is '304'; copy the relevant source clause into condition, without adding or removing a negation or standing qualifier.","model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-6556a505c10f448d98d02466","output_id":"ff3443daccdcd00152eb6dee993b0d345ec3959285ee94a715274c6e3180a0f5","section":"search_profile","status":"valid","value_json":"{\"activity_tags\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"data-analysis\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":1,\"quote\":\"Work in groups in the formulation of analytical models, configuration of measurement systems, interpretation of experimental and theoretical results, and presentation of conclusions\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"presentations\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":3,\"quote\":\"Evaluate clarity and/or accuracy of written work\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"writing\"}],\"assumed_background\":[],\"search_phrases\":[\"experimental mechanics\",\"mechanical components testing\",\"stress strain deformation measurement\",\"electrical optical recording stress strain\",\"digital data acquisition mechanical engineering\",\"non-destructive testing fracture residual stresses\",\"transducer design sensors\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":0,\"quote\":\"Apply knowledge of experimental techniques and measurement systems for mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying experimental techniques and measurement systems for mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques;\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Recording and processing electrical and optical stress, strain, and deformation data using computer techniques\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying methods to static/transient events, sensor/transducer design, NDT, fracture, and residual stresses\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Using digital data acquisition, computer-aided reduction/display, and commercial software for modeling and analysis\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials. Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques; applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Experimental Mechanics covers methods for analyzing mechanical components, structures, and materials, including electrical/optical recording of stress/strain/deformation and computer-based data techniques.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"design and analysis of mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Design and analysis of mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Electrical and optical recording of stress, strain, and deformation data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Computer acquisition, reduction, and presentation of data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Sensors, transducer design, NDT, fracture, and residual stresses\"}]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-6556a505c10f448d98d02466","output_id":"ff3443daccdcd00152eb6dee993b0d345ec3959285ee94a715274c6e3180a0f5","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-789789da373eecc1ff75f626","output_id":"86e0c4990acf6d633f6a7d02dc3a58162fc6106e0c490c029064be54720f3d84","section":"requirements","status":"needs_review","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"n0\",\"kind\":\"any\"},{\"children\":[\"n4\",\"n5\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"n1\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"n4\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"M E 306,E M A 303or 304\",\"course\":null,\"evidence\":\"M E 306,E M A 303or 304\",\"id\":\"n5\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 and EMA 304 are not found in the linked_courses or lookup results; treated as verbatim conditions requiring review.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-789789da373eecc1ff75f626","output_id":"86e0c4990acf6d633f6a7d02dc3a58162fc6106e0c490c029064be54720f3d84","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"EMA 303\",\"field\":\"description\",\"quote\":\"Stress and strain, torsion, bending of beams, shearing stresses in beams, compound stresses, principal stresses, deflections of beams, statically indeterminate members, columns.\"}],\"text\":\"Fundamentals of stress, strain, and beam mechanics.\"}],\"search_phrases\":[\"experimental mechanics\",\"stress analysis\",\"strain measurement\",\"transducer design\",\"nondestructive testing\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for mechanical design and analysis.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\"}],\"text\":\"Computer-based data acquisition and reduction.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Sensor and transducer design, NDT, and fracture analysis.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for analyzing mechanical components, structures, and materials using stress and strain data.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\"}],\"text\":\"Stress, strain, and deformation data recording.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Static and transient event applications, NDT, and fracture mechanics.\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-789789da373eecc1ff75f626","output_id":"86e0c4990acf6d633f6a7d02dc3a58162fc6106e0c490c029064be54720f3d84","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-79348710a077dbb34341f483","output_id":"541026946440786393d40439ed2025cd97c46dfa9b49c9eb0e26f4cfcec8e9b9","section":"requirements","status":"needs_review","value_json":"{\"nodes\":[{\"children\":[\"opt_senior_group\",\"opt_graduate_standing\",\"opt_guest_student\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"root_any\",\"kind\":\"any\"},{\"children\":[\"cond_senior_standing\",\"any_prereq\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"opt_senior_group\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"cond_senior_standing\",\"kind\":\"condition\"},{\"children\":[\"cond_ME_306\",\"course_EMA_303\",\"cond_EMA_304\"],\"condition\":null,\"course\":null,\"evidence\":\"(M E 306,E M A 303or 304)\",\"id\":\"any_prereq\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"M E 306\",\"course\":null,\"evidence\":\"M E 306\",\"id\":\"cond_ME_306\",\"kind\":\"condition\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":303,\"minimum_grade\":null,\"subjects\":[\"EMA\"],\"timing\":\"prior\"},\"evidence\":\"E M A 303or 304\",\"id\":\"course_EMA_303\",\"kind\":\"course\"},{\"children\":[],\"condition\":\"304\",\"course\":null,\"evidence\":\"304\",\"id\":\"cond_EMA_304\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"opt_graduate_standing\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"opt_guest_student\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 is absent from linked_courses, so it is represented as a condition leaf with verbatim source clause 'M E 306'.\",\"EMA 304 is not separately linked; represented as a condition leaf using source substring '304' from 'E M A 303or 304'.\",\"The parenthesized comma-separated list is treated as alternatives: ME 306, EMA 303, or EMA 304.\"],\"root\":\"root_any\",\"status\":\"needs_review\"}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-79348710a077dbb34341f483","output_id":"541026946440786393d40439ed2025cd97c46dfa9b49c9eb0e26f4cfcec8e9b9","section":"search_profile","status":"valid","value_json":"{\"activity_tags\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"data-analysis\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":1,\"quote\":\"Work in groups in the formulation of analytical models, configuration of measurement systems, interpretation of experimental and theoretical results, and presentation of conclusions\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"presentations\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":3,\"quote\":\"Evaluate clarity and/or accuracy of written work\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"label\":\"writing\"}],\"assumed_background\":[],\"search_phrases\":[\"experimental mechanics\",\"mechanical components testing\",\"stress strain deformation measurement\",\"electrical optical recording stress strain\",\"digital data acquisition mechanical engineering\",\"non-destructive testing fracture residual stresses\",\"transducer design sensors\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":0,\"quote\":\"Apply knowledge of experimental techniques and measurement systems for mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying experimental techniques and measurement systems for mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques;\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Recording and processing electrical and optical stress, strain, and deformation data using computer techniques\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Applying methods to static/transient events, sensor/transducer design, NDT, fracture, and residual stresses\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"official_learning_outcomes\",\"outcome_index\":2,\"quote\":\"Use digital data acquisition systems, computer aided data reduction and display, and commercial software packages for modeling and data analysis\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Using digital data acquisition, computer-aided reduction/display, and commercial software for modeling and analysis\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials. Electrically and optically recorded stress, strain and deformation data; computer acquisition/reduction/presentation techniques; applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Experimental Mechanics covers methods for analyzing mechanical components, structures, and materials, including electrical/optical recording of stress/strain/deformation and computer-based data techniques.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"design and analysis of mechanical components, structures and materials\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Design and analysis of mechanical components, structures, and materials\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Electrical and optical recording of stress, strain, and deformation data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Computer acquisition, reduction, and presentation of data\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses\",\"source_url\":\"https://guide.wisc.edu/courses/e_m_a/\"}],\"text\":\"Sensors, transducer design, NDT, fracture, and residual stresses\"}]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20261014T203208-0851c9a1","observed_at":"2026-10-14 17:50:09.728220+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"b19424d709fdedeb2cad13c34abb4067adcdb16d2abd00973a72a7719a0d0634","record_version_id":"e86a200d4c725c0165b0f45880a3f7cc3b47c4be6398b88505c3b900666e89e2","job_id":"enrich-79348710a077dbb34341f483","output_id":"541026946440786393d40439ed2025cd97c46dfa9b49c9eb0e26f4cfcec8e9b9","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"Qwen/Qwen3.8-27B","model_revision":"1d4bf0f2ff6012fd82039f2fa52739d0dd7c60c0","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"a71c37f7b41e5d9a3bde6b66759d9df7a23434792d92709fee5a93818fa4d312","section":"requirements","status":"valid","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304) or graduate/professional standing, or member of Engineering Guest Students\",\"id\":\"n0\",\"kind\":\"any\"},{\"children\":[\"n4\",\"n5\"],\"condition\":null,\"course\":null,\"evidence\":\"Senior standing and (M E 306,E M A 303or 304)\",\"id\":\"n1\",\"kind\":\"all\"},{\"children\":[],\"condition\":\"graduate/professional standing\",\"course\":null,\"evidence\":\"graduate/professional standing\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"member of Engineering Guest Students\",\"course\":null,\"evidence\":\"member of Engineering Guest Students\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Senior standing\",\"course\":null,\"evidence\":\"Senior standing\",\"id\":\"n4\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"M E 306,E M A 303or 304\",\"course\":null,\"evidence\":\"M E 306,E M A 303or 304\",\"id\":\"n5\",\"kind\":\"condition\"}],\"notes\":[\"ME 306 and EMA 304 are not found in the linked_courses or lookup results; treated as verbatim conditions requiring review.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"a71c37f7b41e5d9a3bde6b66759d9df7a23434792d92709fee5a93818fa4d312","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"EMA 303\",\"field\":\"description\",\"quote\":\"Stress and strain, torsion, bending of beams, shearing stresses in beams, compound stresses, principal stresses, deflections of beams, statically indeterminate members, columns.\"}],\"text\":\"Fundamentals of stress, strain, and beam mechanics.\"}],\"search_phrases\":[\"experimental mechanics\",\"stress analysis\",\"strain measurement\",\"transducer design\",\"nondestructive testing\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for mechanical design and analysis.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"computer acquisition/reduction/presentation techniques\"}],\"text\":\"Computer-based data acquisition and reduction.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Sensor and transducer design, NDT, and fracture analysis.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"title\",\"quote\":\"EXPERIMENTAL MECHANICS\"},{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Experimental methods for design and analysis of mechanical components, structures and materials.\"}],\"text\":\"Experimental methods for analyzing mechanical components, structures, and materials using stress and strain data.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"Electrically and optically recorded stress, strain and deformation data\"}],\"text\":\"Stress, strain, and deformation data recording.\"},{\"evidence\":[{\"course_id\":\"EMA/ME 570\",\"field\":\"description\",\"quote\":\"applications to static and transient events, sensors, transducer design, NDT, fracture and residual stresses.\"}],\"text\":\"Static and transient event applications, NDT, and fracture mechanics.\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"a71c37f7b41e5d9a3bde6b66759d9df7a23434792d92709fee5a93818fa4d312","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_f6818f08684977d94b037312","course_id":"EMA/ME 570","catalog_version_id":"060f10ffce471b36cfb1bf50d2ccb9b1d8d18227c60a4881060114d419e54de9","record_version_id":"db3a0d4002ff447f37f30667d3ef944e49186b528ae2e36b447a1951d5bf9d8b","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"a71c37f7b41e5d9a3bde6b66759d9df7a23434792d92709fee5a93818fa4d312","section":"student_summary","status":"valid","value_json":"{\"context_hash\":\"8639642de8b3e228005deb0f2202ebe70d03fe9b93f676b558d97f534b021c31\",\"course_id\":\"EMA/ME 570\",\"current_instructors\":[],\"difficulty_workload\":[],\"errors\":[],\"historical_context\":[],\"message\":\"No course-specific reviews available\",\"offered\":false,\"profile_hash\":\"5cb4dabf887cdbcd8c00d5a1312e10828b95c63f30bc3ea76aea199565390d02\",\"quick_take\":[{\"citations\":[{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20260907T155543-ce3781c4\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1194\",\"type\":\"grade\"},{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20260907T155543-ce3781c4\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1212\",\"type\":\"grade\"},{\"course_id\":\"EMA/ME 570\",\"run_id\":\"20260907T155543-ce3781c4\",\"source_record\":{\"entity_id\":\"e2435938-b150-375c-89b5-836b5f391924\",\"file\":\"tables/observations.parquet\",\"kind\":\"grades\",\"source\":\"madgrades\"},\"table\":\"grades_latest\",\"term_id\":\"1232\",\"type\":\"grade\"}],\"text\":\"Recent recorded grades — Spring 2019: 3.46 GPA, 60.9% A/AB (n=23 letter grades); Fall 2020: 3.56 GPA, 68.0% A/AB (n=25 letter grades); Fall 2022: 3.35 GPA, 69.2% A/AB (n=13 letter grades).\"}],\"student_experience\":[],\"task_hash\":\"74fb0997943e888960bbc9e47db8c4fd12e4292d55c20509d8d89db6a9910f68\",\"teaching_history\":[],\"term_id\":\"1272\",\"term_name\":\"2026 Fall\",\"version\":2}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false}]