[{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"c1bc52b991acbd6aaadc5af8f758f5449cead78680306186d0afc8b4c78da219","section":"requirements","status":"invalid","value_json":null,"candidate_json":"{\"nodes\":[{\"children\":[\"n0\",\"n1\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS and (M S & E 351and360)\",\"id\":\"n0\",\"kind\":\"all\"},{\"children\":[\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS\",\"id\":\"n1\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"Declared in Materials Science and Engineering BS\",\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Declared in Applied Mathematics, Physics and Engineering BS\",\"course\":null,\"evidence\":\"Applied Mathematics, Physics and Engineering BS\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[\"n4\",\"n5\"],\"condition\":null,\"course\":null,\"evidence\":\"(M S & E 351and360)\",\"id\":\"n4\",\"kind\":\"all\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":351,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"M S & E 351\",\"id\":\"n5\",\"kind\":\"course\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":360,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"360\",\"id\":\"n6\",\"kind\":\"course\"}],\"notes\":[\"The phrase 'M S & E 351and360' is parsed as a conjunction (AND) of MS&E 351 and MS&E 360 based on the explicit 'and' and the context of the linked_courses list.\"],\"root\":\"n0\",\"status\":\"parsed\"}","error":"Node n0 references itself; remove the self-reference.\nNode n4 references itself; remove the self-reference.\nCycle reaches node n0; requirement graphs must be trees.\nUnreachable nodes: n4, n5, n6; connect all conditions and exclusions to the root.","model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"c1bc52b991acbd6aaadc5af8f758f5449cead78680306186d0afc8b4c78da219","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"MS&E 351\",\"field\":\"description\",\"quote\":\"Introduction to: atomic, electronic, and defect structures in materials; diffusional, mechanical and electrical properties of materials; and the role of structure and defects in diffusional, mechanical, and electrical properties.\"}],\"text\":\"Foundational materials science principles including structure-property relationships.\"},{\"evidence\":[{\"course_id\":\"MS&E 360\",\"field\":\"description\",\"quote\":\"Laboratory instruction in sample preparation for and applications of quantitative microscopy, x-ray diffraction, and properties measurement in the context of structure-property relationships in materials.\"}],\"text\":\"Practical laboratory skills in microscopy, x-ray diffraction, and properties measurement.\"}],\"search_phrases\":[\"materials characterization techniques\",\"TGA DSC DMA GPC\",\"SEM EDS microscopy\",\"spectroscopy x-ray diffraction\",\"MS&E 363 basics\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"familiarize students with a variety of modern characterization techniques\"}],\"text\":\"Application of modern materials characterization techniques.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical property analysis using TGA, DSC, DMA, and GPC.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopic and x-ray analysis including VIS, IR/Raman, and diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopic analysis using SEM and EDS.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"title\",\"quote\":\"BASIC MATERIALS CHARACTERIZATION TECHNIQUES\"},{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"The purpose of this course is to familiarize students with a variety of modern characterization techniques.\"}],\"text\":\"MS&E 363 introduces basic materials characterization techniques, covering physical properties, spectroscopy, and microscopy methods.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical properties analysis (TGA, DSC, DMA, GPC).\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopy, optical analysis, and x-ray diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopy techniques (SEM, EDS).\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5291a20b802b9bbbe22b24cb","output_id":"c1bc52b991acbd6aaadc5af8f758f5449cead78680306186d0afc8b4c78da219","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"305076e5a1cc8b2f10fffec1ab539250d647514eec0b1b99046a62c682166892","section":"requirements","status":"valid","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n4\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS and (M S & E 351and360)\",\"id\":\"n0\",\"kind\":\"all\"},{\"children\":[\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS\",\"id\":\"n1\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"Declared in Materials Science and Engineering BS\",\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Applied Mathematics, Physics and Engineering BS\",\"course\":null,\"evidence\":\"Applied Mathematics, Physics and Engineering BS\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[\"n5\",\"n6\"],\"condition\":null,\"course\":null,\"evidence\":\"(M S & E 351and360)\",\"id\":\"n4\",\"kind\":\"all\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":351,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"M S & E 351\",\"id\":\"n5\",\"kind\":\"course\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":360,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"360\",\"id\":\"n6\",\"kind\":\"course\"}],\"notes\":[\"The phrase 'M S & E 351and360' is parsed as a conjunction (AND) of MS&E 351 and MS&E 360 based on the explicit 'and' and the context of the linked_courses list.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"305076e5a1cc8b2f10fffec1ab539250d647514eec0b1b99046a62c682166892","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"MS&E 351\",\"field\":\"description\",\"quote\":\"Introduction to: atomic, electronic, and defect structures in materials; diffusional, mechanical and electrical properties of materials; and the role of structure and defects in diffusional, mechanical, and electrical properties.\"}],\"text\":\"Foundational materials science principles including structure-property relationships.\"},{\"evidence\":[{\"course_id\":\"MS&E 360\",\"field\":\"description\",\"quote\":\"Laboratory instruction in sample preparation for and applications of quantitative microscopy, x-ray diffraction, and properties measurement in the context of structure-property relationships in materials.\"}],\"text\":\"Practical laboratory skills in microscopy, x-ray diffraction, and properties measurement.\"}],\"search_phrases\":[\"materials characterization techniques\",\"TGA DSC DMA GPC\",\"SEM EDS microscopy\",\"spectroscopy x-ray diffraction\",\"MS&E 363 basics\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"familiarize students with a variety of modern characterization techniques\"}],\"text\":\"Application of modern materials characterization techniques.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical property analysis using TGA, DSC, DMA, and GPC.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopic and x-ray analysis including VIS, IR/Raman, and diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopic analysis using SEM and EDS.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"title\",\"quote\":\"BASIC MATERIALS CHARACTERIZATION TECHNIQUES\"},{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"The purpose of this course is to familiarize students with a variety of modern characterization techniques.\"}],\"text\":\"MS&E 363 introduces basic materials characterization techniques, covering physical properties, spectroscopy, and microscopy methods.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical properties analysis (TGA, DSC, DMA, GPC).\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopy, optical analysis, and x-ray diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopy techniques (SEM, EDS).\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-5590a4969e0a630fe46a86e8","output_id":"305076e5a1cc8b2f10fffec1ab539250d647514eec0b1b99046a62c682166892","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-789789da373eecc1ff75f626","output_id":"205085bca8ae971733ba38ac35a694d78849336e6ef68d916e43fcb7e80181e2","section":"requirements","status":"needs_review","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n4\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS and (M S & E 351and360)\",\"id\":\"n0\",\"kind\":\"all\"},{\"children\":[\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS\",\"id\":\"n1\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"Declared in Materials Science and Engineering BS\",\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Applied Mathematics, Physics and Engineering BS\",\"course\":null,\"evidence\":\"Applied Mathematics, Physics and Engineering BS\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[\"n5\",\"n6\"],\"condition\":null,\"course\":null,\"evidence\":\"(M S & E 351and360)\",\"id\":\"n4\",\"kind\":\"all\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":351,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"M S & E 351\",\"id\":\"n5\",\"kind\":\"course\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":360,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"360\",\"id\":\"n6\",\"kind\":\"course\"}],\"notes\":[\"The phrase 'M S & E 351and360' is parsed as a conjunction (AND) of MS&E 351 and MS&E 360 based on the explicit 'and' and the context of the linked_courses list.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-789789da373eecc1ff75f626","output_id":"205085bca8ae971733ba38ac35a694d78849336e6ef68d916e43fcb7e80181e2","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"MS&E 351\",\"field\":\"description\",\"quote\":\"Introduction to: atomic, electronic, and defect structures in materials; diffusional, mechanical and electrical properties of materials; and the role of structure and defects in diffusional, mechanical, and electrical properties.\"}],\"text\":\"Foundational materials science principles including structure-property relationships.\"},{\"evidence\":[{\"course_id\":\"MS&E 360\",\"field\":\"description\",\"quote\":\"Laboratory instruction in sample preparation for and applications of quantitative microscopy, x-ray diffraction, and properties measurement in the context of structure-property relationships in materials.\"}],\"text\":\"Practical laboratory skills in microscopy, x-ray diffraction, and properties measurement.\"}],\"search_phrases\":[\"materials characterization techniques\",\"TGA DSC DMA GPC\",\"SEM EDS microscopy\",\"spectroscopy x-ray diffraction\",\"MS&E 363 basics\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"familiarize students with a variety of modern characterization techniques\"}],\"text\":\"Application of modern materials characterization techniques.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical property analysis using TGA, DSC, DMA, and GPC.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopic and x-ray analysis including VIS, IR/Raman, and diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopic analysis using SEM and EDS.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"title\",\"quote\":\"BASIC MATERIALS CHARACTERIZATION TECHNIQUES\"},{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"The purpose of this course is to familiarize students with a variety of modern characterization techniques.\"}],\"text\":\"MS&E 363 introduces basic materials characterization techniques, covering physical properties, spectroscopy, and microscopy methods.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical properties analysis (TGA, DSC, DMA, GPC).\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopy, optical analysis, and x-ray diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopy techniques (SEM, EDS).\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260906T231458-5fdd2fff","observed_at":"2026-09-06 23:14:58.172943+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-789789da373eecc1ff75f626","output_id":"205085bca8ae971733ba38ac35a694d78849336e6ef68d916e43fcb7e80181e2","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":false},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"9f26610f8c427fac10fa7fd29ceb6ce0e3223c8bdc10f5bff7f7ec2982a17800","section":"requirements","status":"valid","value_json":"{\"nodes\":[{\"children\":[\"n1\",\"n4\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS and (M S & E 351and360)\",\"id\":\"n0\",\"kind\":\"all\"},{\"children\":[\"n2\",\"n3\"],\"condition\":null,\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS or Applied Mathematics, Physics and Engineering BS\",\"id\":\"n1\",\"kind\":\"any\"},{\"children\":[],\"condition\":\"Declared in Materials Science and Engineering BS\",\"course\":null,\"evidence\":\"Declared in Materials Science and Engineering BS\",\"id\":\"n2\",\"kind\":\"condition\"},{\"children\":[],\"condition\":\"Applied Mathematics, Physics and Engineering BS\",\"course\":null,\"evidence\":\"Applied Mathematics, Physics and Engineering BS\",\"id\":\"n3\",\"kind\":\"condition\"},{\"children\":[\"n5\",\"n6\"],\"condition\":null,\"course\":null,\"evidence\":\"(M S & E 351and360)\",\"id\":\"n4\",\"kind\":\"all\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":351,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"M S & E 351\",\"id\":\"n5\",\"kind\":\"course\"},{\"children\":[],\"condition\":null,\"course\":{\"course_number\":360,\"minimum_grade\":null,\"subjects\":[\"MS&E\"],\"timing\":\"prior\"},\"evidence\":\"360\",\"id\":\"n6\",\"kind\":\"course\"}],\"notes\":[\"The phrase 'M S & E 351and360' is parsed as a conjunction (AND) of MS&E 351 and MS&E 360 based on the explicit 'and' and the context of the linked_courses list.\"],\"root\":\"n0\",\"status\":\"parsed\"}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"9f26610f8c427fac10fa7fd29ceb6ce0e3223c8bdc10f5bff7f7ec2982a17800","section":"search_profile","status":"valid","value_json":"{\"assumed_background\":[{\"evidence\":[{\"course_id\":\"MS&E 351\",\"field\":\"description\",\"quote\":\"Introduction to: atomic, electronic, and defect structures in materials; diffusional, mechanical and electrical properties of materials; and the role of structure and defects in diffusional, mechanical, and electrical properties.\"}],\"text\":\"Foundational materials science principles including structure-property relationships.\"},{\"evidence\":[{\"course_id\":\"MS&E 360\",\"field\":\"description\",\"quote\":\"Laboratory instruction in sample preparation for and applications of quantitative microscopy, x-ray diffraction, and properties measurement in the context of structure-property relationships in materials.\"}],\"text\":\"Practical laboratory skills in microscopy, x-ray diffraction, and properties measurement.\"}],\"search_phrases\":[\"materials characterization techniques\",\"TGA DSC DMA GPC\",\"SEM EDS microscopy\",\"spectroscopy x-ray diffraction\",\"MS&E 363 basics\"],\"skills_taught\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"familiarize students with a variety of modern characterization techniques\"}],\"text\":\"Application of modern materials characterization techniques.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical property analysis using TGA, DSC, DMA, and GPC.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopic and x-ray analysis including VIS, IR/Raman, and diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopic analysis using SEM and EDS.\"}],\"summary\":{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"title\",\"quote\":\"BASIC MATERIALS CHARACTERIZATION TECHNIQUES\"},{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"The purpose of this course is to familiarize students with a variety of modern characterization techniques.\"}],\"text\":\"MS&E 363 introduces basic materials characterization techniques, covering physical properties, spectroscopy, and microscopy methods.\"},\"topics\":[{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Physical Properties: Thermogravic analysis (TGA); differential scanning calorimetry (DSC); dynamic mechanical analysis (DMA); gel permeation chromatography (GPC)\"}],\"text\":\"Physical properties analysis (TGA, DSC, DMA, GPC).\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Spectroscopy, optical and x-ray: Ultraviolet/visible (VIS), molecular-infrared/Raman, Rheology; x-ray crystal and powder diffraction\"}],\"text\":\"Spectroscopy, optical analysis, and x-ray diffraction.\"},{\"evidence\":[{\"course_id\":\"MS&E 363\",\"field\":\"description\",\"quote\":\"Microscopy: scanning electron microscopy (SEM); SEM and energy dispersive analysis (EDS)\"}],\"text\":\"Microscopy techniques (SEM, EDS).\"}]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"9f26610f8c427fac10fa7fd29ceb6ce0e3223c8bdc10f5bff7f7ec2982a17800","section":"student_experience","status":"insufficient_evidence","value_json":"{\"status\":\"insufficient_evidence\",\"themes\":[]}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true},{"run_id":"20260907T155543-ce3781c4","observed_at":"2026-09-07 15:55:43.033547+00:00","course_uid":"course_d174c63abca65888e37ae8fd","course_id":"MS&E 363","catalog_version_id":"27344b32649bb9146694b5594126faea7bf8ee43ac06368c796cf01ff5e16d6a","record_version_id":"aef71f92afdb98a84c83a64f4bde9c5bff1f1680f01f278960018793e375dd5d","job_id":"enrich-8b774950c2b6adfdc46d1b82","output_id":"9f26610f8c427fac10fa7fd29ceb6ce0e3223c8bdc10f5bff7f7ec2982a17800","section":"student_summary","status":"valid","value_json":"{\"context_hash\":\"953d61390d094eb19b4a0784c779d268ba755e91df808a45e507189854a27f75\",\"course_id\":\"MS&E 363\",\"current_instructors\":[],\"difficulty_workload\":[],\"errors\":[],\"historical_context\":[],\"message\":\"No course-specific reviews available\",\"offered\":false,\"profile_hash\":\"5cb4dabf887cdbcd8c00d5a1312e10828b95c63f30bc3ea76aea199565390d02\",\"quick_take\":[],\"student_experience\":[],\"task_hash\":\"74fb0997943e888960bbc9e47db8c4fd12e4292d55c20509d8d89db6a9910f68\",\"teaching_history\":[],\"term_id\":\"1272\",\"term_name\":\"2026 Fall\",\"version\":2}","candidate_json":null,"error":null,"model":"nvidia/Qwen3.6-35B-A3B-NVFP4","model_revision":"1355db6a052410cfd62085d94b58866fd0f2c3c5","selected_for_release":true}]